Scanning tunneling microscope ( STM ) презентация

Scanning tunneling microscope(STM)

History STM was invented in 1981 by Gerd Binnig and Heinrich Rohrer (IBM Zurich). Five years later, they were awarded the Nobel Prize for their invention in physics.

Surface scanning methods Constant height mode - at a constant tip height, measure the strength of the tunnel current Constant tunneling current mode - the tip changes the height at a certain current value

Restrictions Sample surface resistance Groove geometry Needle sharpening Vacuum Mechanical collision

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